Scanning Electron Microscope coupled to Energy Dispersive X-Ray Spectroscopy
JEOL brand, model JCM-6000. This instrument allows to obtain high resolution images, under high and low vacuum system and can be seen near the surface characteristics of the samples with high magnification of up 30.000x in 60.000x secondary electron system and backscattered electrons system. The spectrometer also allows a basic characterization of the samples. This analysis is semi-destructive.